Sfoglia per Rivista 2D MATERIALS
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International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene
2022 Turner, P; Paton, Kr; Legge, Ej; Bugallo, Ad; Rocha-Robledo, Aks; Zahab, Aa; Centeno, A; Sacco, A; Pesquera, A; Zurutuza, A; Rossi, Am; Tran, Dnh; Silva, Dl; Losic, D; Farivar, F; Kerdoncuff, H; Kwon, H; Pirart, J; Campos, Jle; Subhedar, Km; Tay, Ll; Ren, Ll; Cancado, Lg; Paillet, M; Finnie, P; Yap, Pl; Arenal, R; Dhakate, Sr; Wood, S; Jimenez-Sandoval, S; Batten, T; Nagyte, V; Yao, Yx; Walker, Arh; Ferreira, Ehm; Casiraghi, C; Pollard, Aj
Weak localization in electric-double-layer gated few-layer graphene
2017 Gonnelli, R S; Piatti, E; Sola, A; Tortello, M; Dolcini, F; Galasso, S; Nair, J R; Gerbaldi, C; Cappelluti, E; Bruna, M; Ferrari, A C
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene / Turner, P; Paton, Kr; Legge, Ej; Bugallo, Ad; Rocha-Robledo, Aks; Zahab, Aa; Centeno, A; Sacco, A; Pesquera, A; Zurutuza, A; Rossi, Am; Tran, Dnh; Silva, Dl; Losic, D; Farivar, F; Kerdoncuff, H; Kwon, H; Pirart, J; Campos, Jle; Subhedar, Km; Tay, Ll; Ren, Ll; Cancado, Lg; Paillet, M; Finnie, P; Yap, Pl; Arenal, R; Dhakate, Sr; Wood, S; Jimenez-Sandoval, S; Batten, T; Nagyte, V; Yao, Yx; Walker, Arh; Ferreira, Ehm; Casiraghi, C; Pollard, Aj. - In: 2D MATERIALS. - ISSN 2053-1583. - 9:3(2022), p. 035010. [10.1088/2053-1583/ac6cf3] | 2022 | Sacco, ARossi, AM + | - |
| Weak localization in electric-double-layer gated few-layer graphene / Gonnelli, R S; Piatti, E; Sola, A; Tortello, M; Dolcini, F; Galasso, S; Nair, J R; Gerbaldi, C; Cappelluti, E; Bruna, M; Ferrari, A C. - In: 2D MATERIALS. - ISSN 2053-1583. - 4:3(2017), p. 035006. [10.1088/2053-1583/aa5afe] | 2017 | Sola, A + | 05 - Weak Localization in Electric-Double-Layer Gated Few-layer Graphene.pdf |
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