Sfoglia per Rivista JOURNAL OF APPLIED CRYSTALLOGRAPHY
Mostrati risultati da 1 a 6 di 6
Crystal bending in triple-Laue X-ray interferometry. Part I. Theory
2023 Sasso, Cp; Mana, G; Massa, E
Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography
2023 Massa, E; Mana, G; Sasso, Cp
Neutron interference from a split-crystal interferometer
2022 Lemmel, H.; Jentschel, M.; Abele, H.; Lafont, F.; Guerard, B.; Sasso, C. P.; Mana, G.; Massa, E.
Operation model of a skew-symmetric split-crystal neutron interferometer
2024 Sasso, Carlo P.; Mana, Giovanni; Massa, Enrico
Three-dimensional model of a split-crystal X-ray and neutron interferometer
2022 Sasso, C. P.; Mana, G.; Massa, E.
X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal
2020 Massa, E.; Sasso, C. P.; Fretto, M.; Martino, L.; Mana, G.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Crystal bending in triple-Laue X-ray interferometry. Part I. Theory / Sasso, Cp; Mana, G; Massa, E. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 56:(2023), pp. 707-715. [10.1107/S1600576723002844] | 2023 | Sasso, CPMana, GMassa, E | 2023_Crystal_bending_in_triple_Laue_ interferometry_part1_Theory.pdf |
| Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography / Massa, E; Mana, G; Sasso, Cp. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 56:Pt 3(2023), pp. 716-724. [10.1107/S1600576723002832] | 2023 | Massa, EMana, GSasso, CP | 2023_Crystal_Bending_part2_Phase_Contrast_Topography.pdf |
| Neutron interference from a split-crystal interferometer / Lemmel, H.; Jentschel, M.; Abele, H.; Lafont, F.; Guerard, B.; Sasso, C. P.; Mana, G.; Massa, E.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 55:4(2022). [10.1107/S1600576722006082] | 2022 | C. P. SassoG. ManaE. Massa + | 2022_Neutron_interference_from_a_slit-crystal_ineterometer.pdf |
| Operation model of a skew-symmetric split-crystal neutron interferometer / Sasso, Carlo P.; Mana, Giovanni; Massa, Enrico. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 57:1(2024), pp. 44-59. [10.1107/s1600576723010245] | 2024 | Sasso, Carlo P.Mana, GiovanniMassa, Enrico | 2024_operation_model_SS_nINT.pdf |
| Three-dimensional model of a split-crystal X-ray and neutron interferometer / Sasso, C. P.; Mana, G.; Massa, E.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 55:6(2022), pp. 1500-1513. [10.1107/S1600576722008962] | 2022 | Sasso, C. P.Mana, G.Massa, E. | 2210.16309.pdf; 2022_Three‐dimensional model of a split‐crystal X‐ray and neutron.pdf |
| X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal / Massa, E.; Sasso, C. P.; Fretto, M.; Martino, L.; Mana, G.. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 1600-5767. - 53:5(2020), pp. 1195-1202. [10.1107/s1600576720009267] | 2020 | E. MassaC. P. SassoM. FrettoL. MartinoG. Mana | VH521_X_ray_phase_contrast_topography_to_measure_the_surface_stress.pdf |
Mostrati risultati da 1 a 6 di 6
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